Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

Force microscopy is a family of scanning probe microscopy techniques that enable the visualization and manipulation of materials at the nanoscale. These techniques rely on the interaction forces ...

Kelvin probe force microscopy (abbreviated as KPFM, KFM or SKFM) is a technique predicated on atomic force microscopy (AFM): used to examine the electronic properties of nanoscale materials and ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...

Scientists at the Department of Energy's Oak Ridge National Laboratory have reimagined the capabilities of atomic force microscopy, or AFM, transforming it from a tool for imaging nanoscale features ...

Scientists at Weill Cornell Medicine have developed a computational technique that greatly increases the resolution of atomic force microscopy, a specialized type of microscope that "feels" the atoms ...

The study of biological systems varies from whole organisms, organs, and organoids, down to their building blocks of proteins and cells. At the lower end of the scale, atomic force microscope (AFM) ...

The Asylum Research MFP-3D Origin+ Atomic Force Microscope offers high-resolution imaging, supports large samples, and comes with a full range of imaging modes and accessories. Cantilevers are located ...