Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. Vivek Yadav, an engineering manager from ...

The emergence of SoC has been described as a development that will require fundamental changes in the approaches to design-for -testability (DFT). This will take the form of a “test re-use” strategy ...

Failures have been present in electronic products since the days of vacuum tubes, and despite enormous development and production improvements, no manufacturing technique can guarantee a 100% ...

For years, engineers have neglected the "design" part of design-for-test. DFT shouldn't be an afterthought and test engineers can take on some of the task. Design for Testability (DFT) is comprised of ...

Many IC designers finally have embraced design for testability (DFT) in the form of scan insertion for digital circuit designs because of the significant time-to-production advantages these techniques ...

Whether you are a DFT engineer or a SoC designer, connectivity validation will no doubt be a top priority when taking steps to guarantee the functionality and reliability of your device. SoC designs ...

JTAG has its place but it is not by any means the total solution. Boundary scan, as standardized by IEEE 1149.1 and commonly referred to as JTAG, has truly revolutionized the testability of circuit ...

The emergence of SoC has been described as a development that will require fundamental changes in the approaches to design-for -testability (DFT). This will take the form of a "test re-use" strategy ...